EclipseCon 2007 March 5-8, Santa Clara California





The eRCP Test Harness and the advantages of On-Device testing

Ken Walker (IBM Canada)

· Short Talk

Wednesday, 17:00, 10 minutes | Ballroom GHAB

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The eRCP Test Harness is a component of the Device Software Development Platform. The Test Harness allows Validation Suites to be written against Java APIs destined for Embedded Platforms. A Validation Suite might be a collection of unit tests, comprehensive component test cases or a specification derived Test Suite (a JSR for example). This short talk will outline how the Harness can respond to requests from clients for Test Suites and how the results are accumulated on the Host. Differences from standard unit test methods include the ability to do interactive testing and signature tests. An extremely lightning quick demo will show how a Java ME library can be validated on the client via the eRCP Test Harness.

Ken is the J9 Embedded Java Class Library Lead. He has worked on implementing cleanroom Java Class Libraries for the embedded segment for over 8 years. He is also the Specification Lead on JSR-075, wrote the TCK and RI and has contributed to other JSRs. He is an Eclipse Technology Committer for the eRCP Test Harness. Previous tasks included assisting in the design and development of VisualAge for Java and IBM/OTI Smalltalk. He has spoken at EclipseCon 2006, Numerous JavaOnes and other Embedded Technology related conferences. He's still looking for an African Drumming conference to talk at mind you....

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